SE (standard error is Model/Real) = Model

The "Model" standard error is the precision when of the Rasch measures when the data fit the model. The "Real" (enlarged) standard error increases the Model standard error to accord with the misfit in the data.


The Model SE is the smallest possible standard error (highest possible precision), and implies that the data accord with the measurement model, i.e, that misfit is random. If you hypothesize that noise in the data is systematic and not random (the worst case), and so wish to see standard errors (precisions) enlarged to encompass this systematic lack of fit discovered in the current analysis, then report the "Real" SE:

SE = Real ; "Real" can be abbreviated to "R", or specify SE=Enlarged


SE = Real is the more conservative approach. It is recommended for exploratory analysis.

Real enlarged S.E. = Model S.E. *  sqrt(Max(INFIT MnSq, 1))


When SE = Real, the reported Reliabilities in Table 7 are calculated using the Real standard errors. The "Real" reliabilities are lower than the default "Model" reliabilities,


The setting of SE= can be changed for post-hoc reporting in Modify Specifications.

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Rasch Publications
Rasch Measurement Transactions (free, online) Rasch Measurement research papers (free, online) Probabilistic Models for Some Intelligence and Attainment Tests, Georg Rasch Applying the Rasch Model 3rd. Ed., Bond & Fox Best Test Design, Wright & Stone
Rating Scale Analysis, Wright & Masters Introduction to Rasch Measurement, E. Smith & R. Smith Introduction to Many-Facet Rasch Measurement, Thomas Eckes Invariant Measurement with Raters and Rating Scales: Rasch Models for Rater-Mediated Assessments, George Engelhard, Jr. & Stefanie Wind Statistical Analyses for Language Testers, Rita Green
Rasch Models: Foundations, Recent Developments, and Applications, Fischer & Molenaar Journal of Applied Measurement Rasch models for measurement, David Andrich Constructing Measures, Mark Wilson Rasch Analysis in the Human Sciences, Boone, Stave, Yale
in Spanish: Análisis de Rasch para todos, Agustín Tristán Mediciones, Posicionamientos y Diagnósticos Competitivos, Juan Ramón Oreja Rodríguez
Winsteps Tutorials Facets Tutorials Rasch Discussion Groups


Coming Rasch-related Events
April 10-12, 2018, Tues.-Thurs. Rasch Conference: IOMW, New York, NY,
April 13-17, 2018, Fri.-Tues. AERA, New York, NY,
May 22 - 24, 2018, Tues.-Thur. EALTA 2018 pre-conference workshop (Introduction to Rasch measurement using WINSTEPS and FACETS, Thomas Eckes & Frank Weiss-Motz),
May 25 - June 22, 2018, Fri.-Fri. On-line workshop: Practical Rasch Measurement - Core Topics (E. Smith, Winsteps),
June 27 - 29, 2018, Wed.-Fri. Measurement at the Crossroads: History, philosophy and sociology of measurement, Paris, France.,
June 29 - July 27, 2018, Fri.-Fri. On-line workshop: Practical Rasch Measurement - Further Topics (E. Smith, Winsteps),
July 25 - July 27, 2018, Wed.-Fri. Pacific-Rim Objective Measurement Symposium (PROMS), (Preconference workshops July 23-24, 2018) Fudan University, Shanghai, China "Applying Rasch Measurement in Language Assessment and across the Human Sciences"
Aug. 10 - Sept. 7, 2018, Fri.-Fri. On-line workshop: Many-Facet Rasch Measurement (E. Smith, Facets),
Sept. 3 - 6, 2018, Mon.-Thurs. IMEKO World Congress, Belfast, Northern Ireland
Oct. 12 - Nov. 9, 2018, Fri.-Fri. On-line workshop: Practical Rasch Measurement - Core Topics (E. Smith, Winsteps),


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